CMWP
Revision as of 21:11, 6 December 2019 by Moskalenko (talk | contribs) (Text replacement - "#uppercase" to "uc")
Description
MWP-fit is a program for evaluating diffraction profiles using the method of Multiple Whole Profile fitting.
Required Modules
Serial
- cmwp
System Variables
- HPC_CMWP_DIR - installation directory
Citation
If you publish research that uses cmwp you have to cite it as follows:
Ungár, T., Gubicza, J., Ribárik, G. and Borbély, A.: Crystallite size-distribution and dislocation structure determined by diffraction profile analysis: principles and practical application to cubic and hexagonal crystals, J. Appl. Cryst. 34, 298-310, 2001
Ribárik, G., Ungár, T. and Gubicza, J.: MWP-fit: a program for Multiple Whole Profile fitting of diffraction peak profiles by ab-initio theoretical functions, J. Appl. Cryst. 34, 669-676, 2001
Ribárik, G.: Modeling of diffraction patterns properties, PhD thesis, Eötvös University, Budapest, 2008